Data Fields
size_t	ssid_len

u8	ssid [IEEE80211_MAX_SSID_LEN]

u32	device_ts

u8	dtim_period

bool	wmm_used

bool	uapsd_supported

unsigned long	last_probe_resp

u8	supp_rates [IEEE80211_MAX_SUPP_RATES]

size_t	supp_rates_len

bool	has_erp_value

u8	erp_value

u8	corrupt_data

u8	valid_data

Detailed Description

Definition at line 85 of file ieee80211_i.h.

Field Documentation

u8 corrupt_data

Definition at line 119 of file ieee80211_i.h.

u32 device_ts

Definition at line 90 of file ieee80211_i.h.

u8 dtim_period

Definition at line 92 of file ieee80211_i.h.

u8 erp_value

Definition at line 116 of file ieee80211_i.h.

bool has_erp_value

Definition at line 115 of file ieee80211_i.h.

unsigned long last_probe_resp

Definition at line 97 of file ieee80211_i.h.

Definition at line 88 of file ieee80211_i.h.

size_t ssid_len

Definition at line 87 of file ieee80211_i.h.

Definition at line 106 of file ieee80211_i.h.

size_t supp_rates_len

Definition at line 107 of file ieee80211_i.h.

bool uapsd_supported

Definition at line 95 of file ieee80211_i.h.

u8 valid_data

Definition at line 122 of file ieee80211_i.h.

bool wmm_used

Definition at line 94 of file ieee80211_i.h.

The documentation for this struct was generated from the following file: